U-4100 UV-Visible-NIR Spectrophotometer
U-4100 is the highest-end model achieving high accuracy of which “Famous Hitachi Photometer”is proud. It is the best choice for the user who requires high quality data in the measurement of an actual solid sample, for example in the development of semiconductors, optical materials and new materials.
The system lineup covers a wide range of wavelengths and sample sizes to be measured, and can satisfy various analytical needs by combining various special accessories such as an accessory for measuring transmittance and reflectivity and a sensitive integrating sphere which can measure in the ultraviolet region at a low noise level.
U-4100 InGaAs System has a InGaAs detector for NIR range and it is much lower noise in NIR range compare to PbS detector. It is effective to measure the material of optical communication, for example Anti Reflection Coating, with this system.
The solid sample measurement system utilizes an optical system designed to collect a sufficient amount of spectrum energy in the whole measurable wavelength range.It is a standard system which can measure transmittance and reflectivity.
The large sample measurement system, adopting an optical system designed to collect sufficient spectrum energy in the whole measurable wavelength range , makes it possible to measure transmittance and reflectivity and is the best choice for measuring a large sample that is hard to place in the specimen chamber of a solid sample measurement system.
The ultraviolet region sample measurement system is a system in which optical components such as the light source, the spectrometer and the detector are designed for the ultraviolet region. Equipped with a grating that focuses diffracted light efficiently in the ultraviolet region and with a sensitive integrating sphere which can measure with low noise, the system obtains highly accurate data in the ultraviolet region.
The liquid sample measurement system is the best choice for measuring absorption of a liquid sample. The detector section is designed to offer an advantage. Because light enters the detector perpendicularly, there is a minimal reduction of light intensity compared with an integrating sphere system, allowing measurement with low noise.