January 27 |  Moscone Center – South Hall | San Francisco, CA

We are excited to return to San Francisco, CA for this year’s  SPIE Photonics West  Annual Conference and Exhibition. Visit us at the Moscone Center in Booth# 1858 to learn about our broad range of 2D and 3D surface profiler solutions for R&D, QA/QC, and failure analysis research. We’ll be highlighting how white light interferometry is more valuable than ever in materials R&D for optics, due to the latest advances in non-contact 3D optical metrology. Our team of experts will be available to answer any questions you may have and discuss how the latest technology can advance your research.

Highlights:

• View our broad range of 2D and 3D surface profiler solutions to supply the specific information needed to answer R&D, QA/QC, and failure analysis questions with quantifiable accuracy and speed.
• Learn about Bruker’s latest 3D optical microscopes to measure surface roughness, texture, corrosion, wear, volume loss, and other s-parameters with industry-leading ease of use.

Conference Host:
The International Society for Optics and Photonics

Conference Venue:
Moscone Center – South Hall | San Francisco, CA

To find out more about this event, the products and technology featured in it, or any of our other solutions for Optical Profilometry: