D8 DISCOVER
Advanced X-ray Diffraction System for Materials Research ApplicationsThe D8 DISCOVER with DAVINCI design increases ease-of-use with real-time component detection, plug-and-play functionality and fully integrated 2-dimensional XRD2 capabilities. These unique features allow the user to easily switch between all materials research X-ray diffraction applications, including reflectometry, high-resolution diffraction, in-plane grazing incidence diffraction (IP-GID), small angle X-ray scattering(SAXS), as well as residual stress and texture investigations. Your browser does not support Iframes. For the best experience on the Bruker Corporate Site please upgrade to a modern browser. <a href="//my.bruker.com/acton/form/2655/00cd:d-0001/0/index.htm">Please Request More Information Here.</a> Two-dimensional VÅNTEC-500 detectorFor a 2-D detector, size is the most important feature. A large detector window not only enables increased data collection speed, it also provides information that is simply not accessible with 0-D, 1-D or smaller 2-D detectors. The VÅNTEC-500 detector features a huge 140 mm diameter window, covering up to about 80° (2θ) and a large γ-range. | SNAP-LOCK X-ray optics for tool-free switching of the diffraction geometryThe factory-aligned, SNAP-LOCK X-ray optics provide true ‘plug-and-play’ functionality, including automatic and tool-free switching of the diffraction geometry with minimal user intervention. An X-ray optics module, a detector, or any accessory mounted onto the instrument registers itself in real-time with its relevant parameters and analytical capabilities, including powerful detection of possible component conflicts. |
Coming soon.
