SKYSCAN 1275
SKYSCAN 1275 3D X-ray Microscopy for Everyone The SkyScan1275 is specially designed for fast scanning using new advances in the technology of X-ray sources and efficient flat-panel detectors. Shortening the distance between source and detector and very fast camera readout opens the possibility for reducing scan time down to a few minutes without compromising image quality. Current developments in fast reconstruction accelerated by graphics cards give an additional gain in performance and speed. Fast realistic visualization of results by volume rendering enables fabulous imaging of internal object’s microstructure with power to reveal all internal details by virtual cut or virtual flight around and inside the objects. Fast scanning with high quality results is crucial for scientific research and industrial applications such as quality control or production process monitoring. The SkyScan1275 provides a high level of automation. Simple push of a button on the front of the system starts an auto-sequence of a fast scan followed by reconstruction and volume rendering executed during scanning of the next sample. |
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Specifications
X-ray source | 20-100 kV, 10 W, < 5 µm spot size @ 4 W |
X-ray detector | 3Mp (1944x1536 pixels) active pixel CMOS flat panel |
Maximum object size | 96 mm diameter, 120 mm height |
Reconstruction | GPU-accelerated FDK reconstruction as standard |
Optional stages | micro-positioning, cooling, heating, compression/tension |
Radiation safety | <1 µSv/h at 10cm from the instrument surface |
Optional automatic sample changer
The SkyScan 1275 optional automatic sample changer can accept 16 samples up to 50mm in diameter or 8 samples up to 96mm in diameter or any mixture of large and small samples. Maximum length of the samples is 80mm. The changer is located on top of the scanner, outside the shielded area. All scanned samples can be removed or replaced at any time without interrupting an ongoing scanning sequence.
The scanning protocol for every sample can be adjusted individually. There are three possible selections of scanning protocols: manual selection, automatic selection and repeating scan parameters from the previous sample. In the case of automatic selection of scanning protocol, the control software will firstly measure the size of a sample using the X-ray image at the lowest magnification in multiple angular positions. Afterwards it will adjust the optimal magnification to keep sample fully inside field of view. The automatic adjustment can be overwritten by the operator.