Check important process parameters immediately for reaction monitoring and control


Smart Analyzer
Integrated Process Communication
Fully autonomous with integrated PC
Long Life NIR Source
Average Lifetime >3 years
Less need of service interactions during operation
IoT Interface
Ready for Industry 4.0
Provides many additional device parameters for condition monitoring
Laser Diode
Reduced Cost of Ownership
Optimized x-axis calibration for added robustness

MATRIX-F II Process Spectrometer

Optical spectroscopy is today a highly important technology for online process monitoring and optimization. Fiber-coupled probes allow a direct look into the process without time delay.

The MATRIX-F II FT-NIR spectrometer allows direct measurements in process reactors and pipelines, leading to a better understanding and control of the process. Its innovative technology provides consistent high quality results, less downtime and direct method transfer. All Bruker process spectrometers are characterized by robustness, long-term stability, and low maintenance costs.

Thousands of installations in the chemical, petrochemical and polymer industry as well as in pharmaceutical production processes and in the field of food and feed manufacturing prove our experience.

FT-NIR Process Monitoring

Direct process measurements with FT-NIR Spectroscopy

Today many manufacturers are striving not only to produce the highest quality final product but also to improve manufacturing efficiency by taking analysis technology from the laboratory and applying it in their plants. By gaining tighter control over the manufacturing process, it is possible to optimize the use of materials and reduce or eliminate the production of off-specification material, thus avoiding reprocessing or disposal costs.

The advantages of real time, on-line FT-NIR analysis have been well established. However, conventional spectrometers can only be installed close to the process that they are monitoring, which makes the analyzer be exposed to a hostile environment, like drastic temperature changes and exposure to dust and dirt. Furthermore, the instrument needs to be positioned in hard-to-access and often Ex-protected area.

By using fiber optics technology, the difficult to reach measurement points can be accessed by industry hardened fiber optic probes, while the MATRIX-F II is positioned, e.g. in an analysis house. Bruker Optics offers complete solutions for various on-line analysis tasks.

Common process control applications include direct monitoring of chemical reactions and quality of intermediate and final products:

  • Direct measurement in process reactors or pipelines, over webs or conveyor belts.
  • Remote measurements over long distances.
  • Improved process understanding and control.

Ideal tool for determination of homogeneity of blending processes, concentrations of constituent chemicals and state of polymerization processes in various industries.


Maximum Utility

The MATRIX-F II is the only FT-NIR spectrometer which can measure material in contact as well as contactless with just one instrument using light fiber technology:

Fiber Optic Probes: Classic diffuse reflectance, transflectance or transmission probes with various path lengths can be adopted as well as process flow cells or pilot plant assemblies. Various probe materials are available, like stainless steel or Hastelloy.

Heads for Contactless Measurements: The fiber optic NIR illumination and detection head contains tungsten sources which illuminate the sample. The scattered light is collected and guided via a fiber optic cable to the spectrometer. This way, a contactless measurement can be performed remotely, opening a whole array of new applications. Up to six heads can be connected to one MATRIX-F II emission or MATRIX-F II duplex spectrometer.

Learn about the benefits of multiplexed FT-NIR spectroscopy for your processes


Classical FT-NIR spectrometer with fiber optic coupling for the use of flow cells and conventional probes (for solids and liquids).


MATRIX-F II emission:

Special version of the MATRIX-F II spectrometer for the use of fiber-coupled measurements heads for the contact-less measurements only.

MATRIX-F II duplex:

Extension of the classical MATRIX-F II FT-NIR spectrometers for the simultaneous use of fiber optic probes and fiber-coupled sensor heads.

MATRIX-F exproof:

The MATRIX-F is also available as an ex-proof, ATEX rated version, complying to the following standards:

  • II 2G Ex px II T6 Gb
  • II (1) G [Ex op is T4 Ga] II C

Advanced Technology

The MATRIX-F II is a dedicated FT-NIR process spectrometer that can directly withstand harsh environments.

This instrument uses state-of-the-art optics for outstanding sensitivity and stability in a compact module. Its innovative design provides consistent high quality results, less downtime, direct methods transfer and the possibility of new applications that less sensitive and precise instruments are incapable of. Full support of industry standard communication protocols guarantee an easy integration.

The MATRIX-F II can also be installed in the laboratory as a stand-alone system for method development and then move directly into your process application. It is available as a free-standing unit with NEMA 5/IP65 (splashproof) housing, but can also be mounted in a standard 19 inch rack in a temperature controlled cabinet. The MATRIX-F II can be equipped with a 6 port fiber optic multiplexer.

  • Accurate in-line results in seconds
  • Multiple components per measurement
  • Non-destructive analysis
  • Optional built-in 6-port multiplexer
  • Direct method transfer
  • Rugged design
  • 10 years warranty on moving parts of the interferometer and solid-state laser
  • Ethernet connectivity and industry standard communication protocols

Easy Maintenance

The MATRIX-F II was designed for reliability and easy maintenance. Consumable components on pre-aligned mounts are user-exchangeable without any realignment of the optics.  With its long-life NIR light source and state-of-the-art laser diode, it significantly reduces service operations and cost of ownership. The instrument can be serviced quickly for minimal disruption of the manufacturing process.

Instrument Performance Validation

The MATRIX-F II is equipped with an automated filter wheel which houses standard materials and filters for testing instrument performance. The OVP (OPUS Validation Program) software executes a series of performance tests, evaluating the instrument performance and ensuring that the instrument is operating within specifications - the precondition for applications in the pharmaceutical industry.


The CMET software offers an industry standard interface (OPC) which allows OPUS to be integrated in any process control environment, using a wide range of standard communication interfaces and protocols, including 4-20mA, Modbus,  Profibus DP and OPC.