VERTEX 70v

VERTEX 70v FT-IR Spectrometer

VERTEX 70v offers unmatched performance and versatility for demanding analytical and research applications. Its innovative design results in the highest flexibility and highest performance. The data acquisition is based on two channel deltasigma ADCs with 24-bit dynamic range, which are running in parallel and integrated into the detector preamplifier electronics. This advanced DigiTect^TM technology prevents external signal disturbance and guarantees the highest signal-to-noise ratio.

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Vacuum Optics

With the evacuable optics bench of the VERTEX 70v vacuum FT-IR spectrometer, PEAK sensitivity in the mid-, near and far IR/THz regions are obtained without the fear of masking very weak spectral features caused by water vapor or CO₂ absorptions. Outstanding results, e.g. in the area of nano-science research down to sub-monolayers, can be obtained.

Bruker FM FIR-MIR Spectroscopy

The unique Bruker FM technology provides the possibility to acquire a complete far and mid IR spectrum from 6000 cm^-1 to 50 cm^-1in a single step measurement with no need to change any optical component.

Wide Spectral Range

The VERTEX 70v can optionally be equipped with optical components to cover the spectral range from 10 cm^-1 in the far IR/THz, through the mid and near IR up to the VIS/UV spectral range at 28,000 cm^-1. With its pre-aligned optical components and permanently aligned RockSolid^TM interferometer, range change is easy and maintenance free.

Artificial Intelligence Network

An assembly of great functions such as recognition of sampling accessories and optical components, automatic set up and check of measurement parameters makes FT-IR spectroscopy easy, fast and reliable. In addition, the permanent online check of spectrometer components keeps fault diagnostics and maintenance simple. A full suite of software tools ensures this functionality.

Plug & Play: Easy Set Up

All over the world, no matter where you are, plug in the power cord and the Ethernet connection, and the VERTEX 70v is ready for operation. The Ethernet connection to the VERTEX 70v also offers the possibility to control the spectrometer via your network or the World Wide Web.

The VERTEX 70v is the ideal instrument for demanding research and development applications.

Technologies used are protected by one or more of the following patents: US 7034944

The VERTEX 70v vacuum spectrometer perfectly fits the needs for research applications where high sensitivity, stability and temporal resolution are required. The available spectral range down to the FIR/THz region enables additionally specific applications for industrial research. The versatile VERTEX 70v system provides combined with suitable accessories and the use of the appropriate measurement technique a solution for almost every demand in the field of FT-IR spectroscopy.

Research & Development

Continuous and Step Scan technology for time-resolved as well as amplitude (AM) and phase modulation (PM) spectroscopy (Step Scan / Rapid Scan / Interleaved TRS)
FT-IR spectroscopy in ultrahigh vacuum
FT-IR spectroelectrochemistry for the in-situ investigation of electrode surfaces and electrolytes
Investigation of proteins in water (CONFOCHECK)
Determination of the absolute configuration of molecules (VCD)

Pharma

Characterization of stability and volatile content of medical drug products by thermal analysis (TGA-FT-IR)
Differentiation of polymorphs of active pharmaceutical ingredients in the far infrared region (Bruker FM)

Polymers and Chemistry

Identification of inorganic fillers in polymer composites in the far infrared region (Bruker FM)
Dynamic and rheo-optical studies of polymers
Determination of volatile compounds and characterization of decomposition processes by thermal analysis (TGA-FTIR)
Reaction monitoring and reaction control (MIR fiber probe)
Identification of inorganic minerals and pigments

Surface Analysis

Detection and characterization of thin and monolayers
Surface analysis combined with polarization modulation (PM-IRRAS)

Material Science

Characterization of optical and highly reflective materials (windows, mirrors)
Investigation of dark materials and depth profiling by Photo-Acoustic Spectroscopy (PAS)
Characterization of the emittance behavior of materials

Semiconductors

Determination of oxygen and carbon contents in silicon wafers for quality control

External accessories, sources and detectors

The VERTEX 70v vacuum spectrometer is equipped with five beam exit ports and two beam input ports and offers the possibility to readily upgrade the systems with external measurement accessories, sources and detectors. This includes the following: