D8 DISCOVER
The most versatile and flexible XRD Solution to perfectly match the requirements of research, development and quality control in industry and academia.
D8 DISCOVER
The D8 DISCOVER is the flagship multi-purpose X-ray diffractometer offering leading technology components. It is designed for the structural characterization of the full range of materials from powders, amorphous and polycrystalline materials to epitaxial multi-layered thin films at ambient and non-ambient conditions.
Applications:
- Phase Identification and quantification, structure determination and refinement, Micro strain and crystallite size analysis,
- X-Ray reflectometry, Grazing Incidence Diffraction (GID), In-Plane Diffraction, High-resolution XRD, GISAXS, GI-Stress analysis, crystal orientation analysis
- Residual Stress analysis, Texture and pole figures, micro X-ray Diffraction, Wide Angle X-ray Scattering (WAXS),
- Total scattering analysis: Bragg Diffraction, Pair-Distribution Function (PDF), Small Angle X-Ray Scattering (SAXS)
Key Features
Microfocus Source IµS
The IµS microfocus source equipped with MONTEL optics provides a small high intensity x-ray beam that is perfectly suited for the investigation of small areas or samples.
- Millimeter sized beam with high brilliance and ultra-low background
- Green design with low power consumption, no water consumption and extended life components
- MONTEL optics to optimize the beam shape and divergence
- Full compatibility with our large choice of components, optics and detectors.
UMC Sample stages
The D8 DISCOVER offers a multitude of UMC stages with unrivalled mapping and weight capacity:
- Mapping of samples with a weight of up to 5 kg
- Large area mapping of samples with up to 300 mm size.
- UMC stages for High-Throughput Screening (HTS) with support of up to three well-plates.
Due to the high modularity the UMC stages can be customized to match customer requirements that go beyond the standard configurations.
Multimode EIGER2 R Detectors
The EIGER2 R 250K and 500K are the 2D detectors that bring Synchrotron performance to laboratory X-Ray Diffraction
- Advanced Sensor Design including the 2nd generation of the revolutionary EIGER: up to 500.000 pixels with size of 75 x 75 mm² allow for Macroscopic Coverage with Microscopic Resolution.
- Its ergonomic design allows to adapt detector position and orientation with least effort to the application requirements. This includes toolless switch between 0°/90° orientation and a continuously variable detector position with automated calibration.
- Panoramic Optics and Accessories for unobstructed field of view.
- 0D, 1D and 2D operation mode with Snap-Shot, Step, Continuous or Advanced Scanning modes.
- Complete and seamless integration into the DIFFRAC.SUITE.
TRIO and PATHFINDER PLUS Optics
The patented TRIO optics enables automated switching between three beampaths:
- Focusing Bragg-Brentano for powders
- High intensity parallel beam Kα1,2 for capillary, GID and XRR
- High-resolution parallel-beam Kα1 geometry for epitaxial thin films
The PATHFINDERPlus optic includes an automated absorber to ensure linearity of the measured intensities and allows to switch between:
- Motorized slit for high flux measurements
- Analyzer crystal for high resolution measurements
Equipped with TRIO and PATHFINDERPlus the D8 DISCOVER masters all sample types including powder, bulk, fiber, sheet and thin-film (amorphous, polycrystalline and epitaxial) under ambient or non-ambient conditions without any need of reconfiguration.
Premium Class X-ray Diffraction
Thin Film Analysis
X-Ray Diffraction (XRD) and reflection play a dominant role in the non-destructive characterization of thin layer structured samples. The D8 DISCOVER and DIFFRAC.SUITE software support simple execution of common XRD methods in thin film analysis:
- Grazing Incidence Diffraction (GID) for Surface sensitive Identification of crystalline phases and determination of their structural properties including crystallite size and strain.
- X-ray reflectometry (XRR) for the extraction of thicknesses, material densities and interface structures in multi-layer samples – from simple substrates to highly complex superlattice structures.
- High-resolution X-Ray Diffraction (HRXRD) for the analysis of epitaxial grown sample structures: Layer thickness, Strain, relaxation, mosaicity, composition analysis of mixed crystals.
- Stress and Texture (preferred orientation) analysis
Materials Research
XRD is one of the most important tools in materials research as it allows linking of structural and physical properties of materials. The D8 DISCOVER is the flagship XRD instrument for materials research. Equipped with leading technology components the D8 DISCOVER delivers top performance and full flexibility and enables researchers for a detailed characterization of their materials:
- Phase Identification and structure determination
- Micron strain and crystallite size analysis
- Stress and Texture analysis
- Determination of Particle size and distribution.
- Local XRD analysis using µm sized X-ray beams
- Reciprocal Space Mapping
Screening and Large Area Mapping
The D8 DISCOVER is the ultimate solution when it comes to High-Throughput Screening (HTS) and the mapping of large areas on samples. The UMC sample stages deliver a range of motion that puts the D8 DISCOVER in a class of its own in both motorized translation and weight capacity:
- Hight Throughput Screening (HTS) of well plate and deposited samples in both reflection and transmission
- Mapping of samples with a size of up to 300 mm
- Mounting and mapping samples with weights up to 5 kg
- Automation interfacing
XRD Components
Bruker XRD solutions consist of high performance components configured to meet the analytical requirements. The modular design is the key to configure the best instrumentation.
All categories of components are part of Bruker’s key competence, developed and manufactured by Bruker AXS, or in close cooperation with third party vendors.
Bruker XRD components are available for upgrading the installed X-ray systems for improving their performance.
СПЕЦИФИКАЦИИ
D8 DISCOVER Specifications
| Specification | Benefit | |
| TWIST-TUBE | Easy switch between point and line focus
Available anodes: Cr, Cu, Mo, Ag Max. Power and filament: up to 3 kW depending on anode material (0,4 x 16 mm² ) Patent: EP 1 923 900 B1 |
Quick change of the wavelength to perfectly match different applications
Fastest switch between line and point focus for a wider range of applications and better results in shorter time |
| IµS Microfocus Source | Power load: up to 50 W, single-phase power
MONTEL and MONTEL Plus optics combining parallel and focusing mirrors. Beam sizes down to 180 x 180 µm². Maximum integrated flux 8 x 10⁸ cps at mirror exit. Beam divergence down to 0,5 mrad |
Millimeter sized beam with high brilliance and ultra-low background
Green design with low power consumption, no water consumption and extended life components Optimize the beam shape and divergence for best results |
| Turbo X-Ray Source (TXS) | Line focus, 0.3x3 mm²
Focal brigthness of 6 kW/mm² Anode materials: Cu, Co, Cr, Mo Max. voltage 50 kV, max. power depending on anode material: Cr 3.2 kW, Cu/Mo 5.4 kW, Co 2,8 kW Pre-Aligned Tungsten filament |
Up to 5 times more intensity compared to standard ceramic X-ray sources.
Perfectly suited for line and spot focus applications Pre-Aligned filament allow fast filament exchange with a minimum of re-alignment requirement. |
| TRIO Optics | Software push-button switch between:
Motorized Divergence Slit (Bragg-Brentano) High Intensity Ka1,2 Parallel Beam High Resolution Ka1 Parallel Beam Patents: US10429326, US6665372, US7983389 |
Fully automatic, motorized switching between up to 6 different beam geometries without any manual user intervention
Perfectly suited for all sample types including powders, bulk materials, fibers, sheets and thin-films (amorphous, polycrystalline and epitaxial) |
| High-Resolution Monochromators | Ge(220) and Ge(004) reflections in symmetric and asymmetric geometry
2-bounce and 4-bounce (Bartels type) monochromators Alignment-free mounting through SNAP.LOCK technology |
Broad choice for best resolution vs. intensity balancing to obtain best possible results.
Fast exchange of monochromators to optimize to different samples |
| D8 Goniometer | Two-circle goniometer with independent stepper motors and optical encoders | Unparalleled accuracy and precision as manifasted by Bruker's unique alignment guarantee
Absolutely maintenance free drive mechanism / gearings with lifetime lubrication |
| UMC Stages | Family of sample stages
x,y for sample translation of up to +/- 150 mm z-Drive with travel of up to 50 mm Phi drive with infinite rotation Max. Psi inclination up to 55° Max. weight (at center position) : 50 kg |
Unrivalled capacity in sample weight and size
Enables the implementation of large custom-made sample chambers |
| Centric Eulerian Cradle (CEC) | Five degrees of freedom sample stage:
x,y for sample translation of +/-40 mm z-Drive for height alignment Phi drive with 360° rotation Psi drive and angular range from -11° to 98° Max. weight load: 1 kg Various stage attachment avaible. |
Stress and Texture measurements in side-inclination for higher accuracy results.
Automated mapping capability in (x,y). Motorized tilt-stage for precise surface alignment. Powder- or capillary spinners allow for powder diffraction. Bayonette sample stage holder for fast and reproducible swapping with other stages. |
| Pathfinder Plus Optics | Software push-button switch between:
Motorized Slit 2-bounce Ge Analyzer Automated absorber integrated |
Fully automatic, motorized switching between two different optics without any manual user intervention.
Maintains full field of view of LYNXEYE detectors. Absorber ensures linearity in measured data |
| LYNXEYE XE-T | Energy Resolution: < 380 eV @ 8 KeV
Detection Modes: 0D,1D, 2D Wavelengths: Cr, Co, Cu, Mo and Ag Patents: EP1647840, EP1510811, US20200033275 |
No need for Kß filters and secondary monochromators
100% filtering of Fe-fluorescense with Cu radiation Up to 450 times faster than conventional detector systems Bragg2D: Collect 2D data with a divergent primary line beam Unique detector warranty: No defective channels at delivery time |
| EIGER2 | The latest generation multi-mode (0D/1D/2D) detector based on the Hybrid Photon Counting technology, developed by Dectris Ltd. | Seamless integration of 0D, 1D and 2D detection in step, continuous and advanced scanning modes
Ergonomic, alignment-free detector rotation to optimize γ or 2Θ angular coverage Panoramic, tool-free diffracted beam optics using the complete detector field of view Continuously variable detector positioning to balance angular coverage and resolution |
| Non-ambient | Temperature: Ranging from ~12 K up to ~2500 K
Pressure: 10-⁴ mbar up to 100 bar Humidity: 5% to 95% RH |
Investigations under ambient and non-ambient conditions
Easily exchanged stages with DIFFRAC.DAVINCI |
