contrAA 800 Series
- Fast multi-element analysis
- Accurate results with maximum precision
- Extended measuring range
contrAA 800 Series
Multi-element analysis and ease of use at a manageable cost. The contrAA 800 combines the best of standard AAS instruments and ICP-OES spectrometers. Take your demand for precision and performance to the next level and cover the entire range of AAS with a single lamp.
Any Wavelength. Any Element. Any Time.
- Xenon short arc lamp as single light soruce for all applications
- Reduce measurement time by up to 30 % thanks to fast-sequential analysis
- Flexible method development with 3D visualization of absorption spectra
- Determination of metals, semi-metals metalloids and even non-metals
High-Resolution Continuum Source (HR-CS) AAS
With the contrAA 800, lamp change in AAS is past. Only one light-intensive lamp, a xenon short arc lamp, covers the entire wavelength range of AAS. A high-resolution spectrometer with CCD detector gives a 3D spectrum and provides a maximum confidence in results and the best detection limits down to the sub ppb range. Fast sequential and multi-element measurements reduce the measurement time and maximize the sample throughput. With the spectral background correction automated by software routines (ABC and CSI-tool) even difficult samples can be analyzed easily. An elaborate design combines this unique optics with all atomization techniques, the flame, graphite furnace and hydride technique in a single platform. A wide range of intelligent accessories maximizes productivity, safety and ease of use for analytical routines. With the fully automated direct solid analysis you can skip the effort of sample digestion.
Patented Technology and Ingenious Solutions
Unparalleled flexibility – one lamp, all the elements
A xenon short arc lamp generates a continuous emission spectrum over the entire range of wavelengths of relevance for the AAS. Every element and wavelength can be analyzed at any time as selected in the software. This includes molecular absorption bands that can be used for the analysis of non-metals. Secondary wavelengths with high light intensity are also available, allowing the dynamic range to be extended to higher concentrations. The extraordinary light intensity of the xenon lamp also guarantees an excellent signal-to-noise ratio, thus significantly improving detection limits and precision.
- Multielement analysis across the entire spectrum (185—900 nm)
- Expanded range of application and implementation
- Greater productivity
Unparalleled precision and accuracy – at the highest resolution, with the least interference
The combination of a high-resolution spectrometer and a CCD array detector provides for high-resolution absorption spectra with extremely detailed information. A three-dimensional representation of the spectra provides for the correct evaluation of the absorption lines and their spectral environment. It also provides information on other elements present in the sample that can be measured at the same time as well.
Modern software tools make data evaluation easier. Spectral background and lamp intensity fluctuations are automatically and directly corrected in the spectrum. Interference from other atomic and molecular absorption structures is reduced to a minimum from the outset as a result of the high level of resolution. Complex spectral interferences can be corrected using matrix correction spectra.
- Determination and rapid sequential quantification of all of the elements contained in the sample
- Simple method development
- Reliable results
ASpect CS
Optimized for multi-element analysis with HR-CS AAS
ASpect CS is optimized for multi-element analysis with HR-CS AAS and provides straightforward, routine handling of data on a user interface with maximum flexibility even for challenging analyses beyond daily routines. It allows for the simultaneous evaluation of multiple element lines in one spectrum and free definition of the integration ranges of individual lines. Advanced correction algorithms automate the process of correcting both complex structured backgrounds and spectral interferences (CSI tool), providing more reliable figures than ever before. You can visualize your measurements and optimize your methods thanks to the three-dimensional, high-definition display of the spectra (HD Spectrum).
- SOPs for easy method development
- A large range of innovative evaluation methods such as the CSI tool
- High safety measures and Good Laboratory Practice (GLP)
- FDA 21 CFR Part 11 compliance (optional)
СПЕЦИФИКАЦИИ
| Detector | Background correction | Wavelength precision | Light source | Spectral resolution | Wavelength range | Sensitivity | Optical design | Dimension (width x depth x height) | Space requirement (width x depth x height) | |
|---|---|---|---|---|---|---|---|---|---|---|
| contrAA 800 D - HR-CS AAS for flame- and graphite furnace techniques 815-08002-2 |
CCD | Spectral | 0.4 pm | Xenon short arc lamp | 0.002 nm @ 200 nm | 185-900 nm | Flame: 0.015 mg/l 1%Abs (Cu 324) Graphite furnace: 0.66 µg/l 1%Abs (Pb 283) |
High-Resolution Echelle Spectrometer | 780 mm x 775 mm x 625 mm | 780 mm x 970 mm x 625 mm |
| contrAA 800 F - HR-CS AAS for flame technique 815-08000-2 |
CCD | Spectral | 0.4 pm | Xenon short arc lamp | 0.002 nm @ 200 nm | 185-900 nm | Flame: 0.015 mg/l 1%Abs (Cu 324) | High-Resolution Echelle Spectrometer | 780 mm x 775 mm x 625 mm | 780 mm x 775 mm x 625 mm |
| contrAA 800 G - HR-CS AAS for graphite furnace technique 815-08001-2 |
CCD | Spectral | 0.4 pm | Xenon short arc lamp | 0.002 nm @ 200 nm | 185-900 nm | Graphite furnace: 0.66 µg/l 1%Abs (Pb 283) | High-Resolution Echelle Spectrometer | 780 mm x 775 mm x 625 mm | 780 mm x 725 mm x 625 mm |
