M6 JETSTREAM

Large Area micro-XRF Scanner in High Definition

Mobile Elemental Analysis

Ultra-Fast Mapping

M6 JETSTREAM

2x60 mm²
SDD size
Dual silicon drift detector option for fastest acquisition
80x60 cm²
Scannable surface
Mapping larger samples in one run
100-500 µm
Adjustable spot size
The spot size can be adjusted in five steps to match the structure of the sample

State of the Art in Large Area micro-XRF

Micro-XRF on large samples (also called macro-XRF or MA-XRF) has become a decisive method for the analysis of paintings, geological samples, archeological artifacts and industrial components. The M6 JETSTREAM drives these analyses to the highest speed and accuracy. With its mobile wheelbase and adjustable frame, the M6 JETSTREAM can be used on-site instead of transporting the sample to the lab.

  • Measurement of upright samples or horizontal surfaces
  • Scannable area up to 800 x 600 mm²
  • "On the fly" analysis for highest mapping speed
  • Adjustable spot size to match the structure of the sample
  • XFlash® SDD technology with up to 2 x 60 mm² detector area
  • Optional aperture management system (AMS) to gain depth of focus on uneven surfaces

What Can You Expect from the M6 JETSTREAM?

Micro-XRF Study of the Troodontid Dinosaur Jianianhualong Tengi Reveals New Biological and Taphonomical Signals, Jinhua Li et. al, Atomic Spectroscopy 2021 42(1)

Micro-XRF Study of the Troodontid Dinosaur Jianianhualong Tengi Reveals New Biological and Taphonomical Signals, Jinhua Li et. al, Atomic Spectroscopy 2021 42(1)
  • Get spatially resolved information about the elemental distribution of almost any surface
  • Record data over large areas in one run
  • Combine high-resolution optical images with a full spectrum per pixel in one HyperMap dataset
  • Process data and extract object spectra , line scans and chemical phases from maps
  • Quantify spectra using standardless Fundamental Parameter (FP) methods
  • Reduce cost and time by avoiding logistics and ensuring security of valuable objects
Discover the broad range of mico-XRF samples

Applications of the M6 JETSTREAM in Cultural Heritage

bruker-m6-rembrandt-teaser

Hidden details in faded pigments, Rembrandt's "Homer"

Investigating Rembrandt's use of smalt in his paints to develop depth of color and texture in his paintings. MA-XRF maps reveal the fine details lost to pigment degradation.
Unlocking Leonardo’s Virgin of the Rocks

Evolution of a Masterpiece: Da Vinci's "Virgin of the Rocks"

XRF mapping using Bruker’s M6 JETSTREAM uncovered tantalizing details of the designs for a a completely different painting hidden beneath the surface of Leonardo’s Virgin of the Rocks
micro-xrf elemental maps of a statue of jesus statue taken with and without an aperture management system (ams). The map taken using the AMS has higher data quality..

Going 3D - Micro-XRF Scanning of Highly-Topographic Cultural Heritage Objects

The elemental mapping of  3D cultural heritage objects or those with a high surface topography is possible using the right system. Here we demonstrate how the M6 JETSTREAM, with its patented Aperture Management System (AMS), can vizualize the elements in areas that are as far as 10 cm away from the spectrometer.
Elemental maps for lead, mercury, potassium and gold for a tibetan bhuddist thangka painting

Micro-XRF Imaging of a Tibetan Buddhist Thangka Painting

Micro-XRF scanning is well suited to the analysis of paintings. In this case study we demonstrate the capabilities of spatially resolved micro-XRF analysis using an M6 JETSTREAM on a Thangka, a Tibetan Bhuddist artwork that is traditionally painted following an established workflow.
crono image 1

Looking Behind Raphael's "Baglioni Entombment"

Analysis of the layers in Raphael's "Baglioni Entombment", part of the collection at Rome's Galleria Borghese, was carried out to find out more about the order in which the painting was constructed and to discover more about its history. Read more about the project here.

СПЕЦИФИКАЦИИ

Technical details

Up to 100 mm/s stage speed Mapping can be conducted "on the fly" with dwell times down to 1 ms per pixel  
30mm² or 60mm² SDDs with ≤145 eV The M6 JETSTREAM can be equipped with different Bruker XFlash® detectors, all specified with ≤145 eV at Mn Kα  
±10° tilt in vertical measurement mode In addition to the 90° tilt between horizontal and vertical measurement, the rig can be tilted in fine steps to adjust to inclined surfaces